Advances in Imaging and Electron Physics, Volume 155

1st Edition

Selected Problems of Computational Charged Particle Optics

Authors: Dmitry Greenfield Mikhael Monastyrskii
Serial Editors: Peter Hawkes
Hardcover ISBN: 9780123747174
eBook ISBN: 9780080879697
Imprint: Academic Press
Published Date: 29th December 2008
Page Count: 364
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Table of Contents

Chapter 1. Integral equations method in electrostatics 1.1. Statement of the problem 1.2. Boundary surface approximation 1.3. Surface charge density approximation
1.4. Interface boundary conditions for dielectric materials 1.5 Reducing the integral equations to the finite-dimensional linear equations system
1.6. Accuracy benchmarks for numerical solving the 3D electrostatic problems 1.7. More complicated examples of 3D field simulation 1.8 The cases of planar and axial symmetries
1.9 Calculation of potential and its derivatives near the boundary 1.10. Acceleration of field calculation. Finite-difference meshes and calculation domain decomposition 1.11. Microscopic and averaged fields of periodic structures

Chapter 2. Surface charge singularities near irregular surface points 2.1. Two-faced conductive wedge in vacuum
2.2. Two-faced conductive wedge in the presence of dielectrics 2.3. The transfer matrix method 2.4. The case of pure dielectric vertex 2.5. Upper boundaries for the singularity index in 2D case 2.6. Variational approach to the spectral problem 2.7. Three-dimensional corners 2.8. Variational method in the case of dielectrics 2.9. Reduction to the 2D case 2.10. On-rib singularities near three-dimensional corner 2.11. The cases allowing separation of variables 2.12. Numerical solution of the Beltrami-Laplace spectral problem 2.13. Cubical and prism corners

Chapter 3. Geometry perturbations 3.1. Integral variational equations and conjugate integral equation for the Green function 3.2. 3D perturbations in axisymmetric systems
3.3 Some examples of 3D perturb


Description

Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
364
Language:
English
Copyright:
© Academic Press 2009
Published:
Imprint:
Academic Press
eBook ISBN:
9780080879697
Hardcover ISBN:
9780123747174

About the Authors

Dmitry Greenfield Author

Mikhael Monastyrskii Author

About the Serial Editors

Peter Hawkes Serial Editor

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge. In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed. In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also partic

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France