Advanced Techniques for Assessment Surface Topography

Advanced Techniques for Assessment Surface Topography

Development of a Basis for 3D Surface Texture Standards "Surfstand"

1st Edition - June 1, 2003

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  • Authors: Liam Blunt, Xiang Jiang
  • eBook ISBN: 9780080526522

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This publication deals with the latest developments in the field of 3D surface metrology and will become a seminal text in this important area. It has been prepared with the support of the European Community’s Directorate General XII and represents the culmination of research conducted by 11 international partners as part of an EU-funded project. The aim of the project is to inform standards bodies of the possibilities that exist for a new international standard covering the field of 3D surface characterisation.The book covers a description of the proposed 3D surface parameters and advanced filtering techniques using wavelet and robust Gaussian methodologies. The next generation areal surface characterisation theories are discussed and their practical implementation is illustrated. It describes techniques for calibration of 3D instrumentation, including stylus instruments as well as scanning probe instrumentation. Practical verification of the 3D parameters and the filtering is illustrated through a series of case studies which cover bio-implant surfaces, automotive cylinder liner and steel sheet. Finally, future developments of the subject are alluded to and implications for future standardisation and development are discussed.


Precision engineers, undergraduates and postgraduates of precision engineering and metrology, researchers in the field of metrology, companies working in the field of metrology, metrology instrument manufacturers, metrology software developers

Table of Contents

  • Characterisation 1. The surface: its measurement and standardisation; 2. Numerical parameters for characterisation of topography; 3. Development of feature extraction for surface texture; 4. Advanced Gaussian filters; 5. Multi scalar filtration methodologies

    Instrumentation 6. Methods for calibaration of 3D surface metrology instruments; 7. Calibration of atomic force microscopes

    Case studies 8. A comparison of 2D roughness parameters with 3D roughness parameters; 9. Applications of the numerical parameters and filtration; 10. Functionality and characterisation of textured sheet steel products; 11. Characterisation of automotive engine bore performance; 12. Expert systems for hosting surface data; 13. Future developments in surface metrology.

Product details

  • No. of pages: 340
  • Language: English
  • Copyright: © Butterworth-Heinemann 2003
  • Published: June 1, 2003
  • Imprint: Butterworth-Heinemann
  • eBook ISBN: 9780080526522

About the Authors

Liam Blunt

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).

Affiliations and Expertise

Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK

Xiang Jiang

Affiliations and Expertise

Senior Research Fellow at the University of Huddersfield, UK

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