Advanced Laser Diode Reliability
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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Key Features
- Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
- Present the extension to new failure mechanisms, new technologies, new application fields, new environments
- Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Readership
Scientists and engineers working in Reliability of Photonic Devices and Students of advanced academic courses on Photonics and Reliability
Table of Contents
1. Laser Diode Reliability
2. Multi-Component Model for Semiconductor Laser Degradation
3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
4. Laser Diode Characteristics
5. Laser Diode DC Measurement Protocols
Product details
- No. of pages: 268
- Language: English
- Copyright: © ISTE Press - Elsevier 2021
- Published: July 13, 2021
- Imprint: ISTE Press - Elsevier
- Hardcover ISBN: 9781785481543
- eBook ISBN: 9780081010891
About the Authors
Massimo Vanzi
Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices
Affiliations and Expertise
Proffessor, University Cagliari, Italy
Laurent Bechou
Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.
Affiliations and Expertise
Université de Sherbrooke
Mitsuo Fukuda
Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories.
Affiliations and Expertise
Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Japan
Giovanna Mura
Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.
Affiliations and Expertise
Assistant Professor, University Cagliari, Italy
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