Search:

Product Information All Elsevier Sites   Advanced Product Search
SiteStat.jsp

Materials Characterization

An International Journal on Materials Structure and Behavior

Materials Characterization
ISSN: 1044-5803
Imprint: ELSEVIER

Statistics
Impact Factor: 1.225
5-Year Impact Factor: 1.443
Issues per year: 12

Editorial Board



Editor-in-Chief

I. Baker
Dartmouth College, Hanover, NH, USA

Associate Editors

M.A.T.M. Broekmans
Geological Survey of Norway, Trondheim, Norway
D.P. Field
Washington State University, Pullman, WA, USA
D. Hetzner
Winter Haven, FL, USA
I. Kaus
SINTEF, Trondheim, Norway
P. Munroe
University of New South Wales, Sydney, Australia
J.D. Robson
The University of Manchester, Manchester, UK

Editorial Advisory Board

B.P. Bewlay
GE Global Research, New York, NY, USA
H.K.D.H. Bhadeshia
University of Cambridge, Cambridge, England, UK
R.W. Buckman
Pittsburgh, PA, USA
K.K. Chawla
University of Alabama at Birmingham, Birmingham, AL, USA
N. Chawla
Arizona State University, Tempe, USA
W.J. Clegg
University of Cambridge, Cambridge, England, UK
E.C. Dickey
Pennsylvania State University, University Park, PA, USA
E.P. George
Oak Ridge National Laboratory, Oak Ridge, TN, USA
C. Grovenor
University of Oxford, Oxford, UK
B.J. Inkson
University of Sheffield, Sheffield, England, UK
D.G. Ivey
University of Alberta, Edmonton, AB, Canada
D.J. Larson
Imago Scientific Instruments, Madison, WI, USA
D. Lashmore
Nanocomp Technologies, Inc., Concord, NH, USA
I. LeMay
Metallurgical Consulting Services Ltd., Saskatoon, SK, Canada
W. Lineton
Federal Mogul Corporation, Ann Arbor, MI, USA
D. Medlin
South Dakota School of Mines and Technology, Rapid City, SD, USA
J.R. Michael
Sandia National Laboratories, Albuquerque, NM, USA
M.K. Miller
Oak Ridge National Laboratory, Oak Ridge, TN, USA
L.E. Murr
University of Texas at El Paso, El Paso, TX, USA
I. Nettleship
University of Pittsburgh, Pittsburgh, PA, USA
D.O. Northwood
University of Windsor, Windsor, ON, Canada
V. Petrova
University of Illinois at Urbana-Champaign, Urbana, IL, USA
G.M. Pharr
University of Tennessee, Knoxville, TN, USA
B. Ralph
Ty Carrog, Cardiff, UK
V. Randle
University College of Swansea, Swansea, UK
I.M. Reaney
University of Sheffield, Sheffield, England, UK
A. Richter
Technische Hochschule Wildau, Wildau, Germany
S.P. Ringer
University of Sydney, Sydney, NSW, Australia
A.D. Rollett
Carnegie Mellon University, Pittsburgh, PA, USA
J.E. Spowart
Air Force Research Laboratory, Wright-Patterson AFB, USA
M.E. Stevenson
Engineering Systems Inc., Norcross, GA, USA
D.W. Van Citters
Dartmouth College, Hanover, NH, USA
J. Wadsworth
Battelle, Columbus, OH, USA
T.J. White
Nanyang Technological University, Singapore, Singapore
Q. Zeng
Arnold Magnetic Technologies, Marengo, IL, USA
 
This is a spacer...