By
Alexander Khomchenko, Belarus-Russian University
Description
In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based
on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation
of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index
and thickness of the dielectric, semiconductor or metallic films are considered.
This book is highly recommended for specialists in
the fields of integrated and thin film optics and for graduated students in related specialties.
Included in series
Thin Films and Nanostructures
