Description In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based
on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation
of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index
and thickness of the dielectric, semiconductor or metallic films are considered.
This book is highly recommended for specialists in
the fields of integrated and thin film optics and for graduated students in related specialties.
Contents Foreword
Acknowledgements
Contents
Introduction
1. Interaction of light with matter
2. Spectroscopy of optical guided
modes
3. New applications of the m-line technique for thin-film structure studying
4. Spatial Fourier spectroscopy of guided
modes: measuring the thin-film parameters
5. Characterizations of thin films by prism coupling of leaky modes
6. Measurements
of absorption spectra of thin films
7. Applications of waveguide spectroscopy techniques in sensor systems
8. Optical nonlinearity
in thin films at low-intensity light
9. Optical nonlinearity in multilayer structures
Bibliography
Index
Books and book related electronic products are priced in US dollars (USD), euro (EUR), and Great Britain Pounds (GBP). USD prices apply to the Americas and Asia Pacific. EUR prices apply in Europe and the Middle East. GBP prices apply to the UK and all other countries.
Home | Elsevier Sites | Privacy Policy | Terms and Conditions | Feedback | Site Map | A Reed Elsevier Company