Edited by
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics
and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially
semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic
wave propagation, electron microscopy, and the computing methods used in all these domains.
Included in series
Advances in Imaging and Electron Physics
Audience:
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
