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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 120
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To order this title, and for more information, click here
Edited By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Included in series
Advances in Imaging and Electron Physics,
Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron
Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics
of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and
digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
| Bibliographic details |
Hardbound, 356 pages, publication date: APR-2002
ISBN-13: 978-0-12-014762-5
ISBN-10: 0-12-014762-9
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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EUR 153.95
USD 224
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Last update: 20 Feb 2010
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