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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 126
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To order this title, and for more information, click here
Edited By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Included in series
Advances in Imaging and Electron Physics,
Description
Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and
it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this
by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and
applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working
in this field, makes this book essential reading
Contents
A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric
Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional
Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks
| Bibliographic details |
Hardbound, 458 pages, publication date: MAY-2003
ISBN-13: 978-0-12-014768-7
ISBN-10: 0-12-014768-8
Imprint: ACADEMIC PRESS
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| Price and Ordering |
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Last update: 12 Jun 2009
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