Edited by
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Description
Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and
it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this
by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and
applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working
in this field, makes this book essential reading
Included in series
Advances in Imaging and Electron Physics
