By
Amir Afshar, National Semiconductor
Description
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined
will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost
in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must
understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation
and noise sources.
Audience:
Semiconductor design & test engineers
