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| PRINCIPLES OF SEMICONDUCTOR NETWORK TESTING
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To order this title, and for more information, click here
By
Amir Afshar, National Semiconductor
Description
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined
will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost
in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must
understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation
and noise sources.
Audience
Semiconductor design & test engineers
Contents
Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier
general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References
| Bibliographic details |
Hardbound, 350 pages, publication date: JUN-1995
ISBN-13: 978-0-7506-9472-8
ISBN-10: 0-7506-9472-6
Imprint: NEWNES
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| Price and Ordering |
Price:
GBP 87
USD 125
EUR 102.95
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Last update: 7 Sep 2009
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