 |
 |
 | PRINCIPLES OF SEMICONDUCTOR NETWORK TESTING
|  |
 |  |  |
 |
 |
To order this title, and for more information, click here
By
Amir Afshar, National Semiconductor
Description
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined
will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost
in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must
understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation
and noise sources.
Audience
Semiconductor design & test engineers
Contents
Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier
general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References
| Bibliographic details |
Hardbound, 350 pages, publication date: JUN-1995
ISBN-13: 978-0-7506-9472-8
ISBN-10: 0-7506-9472-6
Imprint: NEWNES
|
| Price and Ordering |
Price:
GBP 87 USD 125 EUR 102.95
|  |
Books and book related electronic products are priced in US dollars (USD), euro (EUR), and Great Britain Pounds (GBP). USD prices apply to the Americas and Asia Pacific. EUR prices apply in Europe and the Middle East. GBP prices apply to the UK and all other countries.
|
See also information about conditions of sale & ordering procedures, and links to our regional sales offices.
|
032/320
Last update: 7 Sep 2009
|
 |
|  |
 |  |  |
 |
|
|  |