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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 112
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To order this title, and for more information, click here
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Included in series
Advances in Imaging and Electron Physics,
Description
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics
and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices
(especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
| Bibliographic details |
Hardbound, 338 pages, publication date: MAY-2000
ISBN-13: 978-0-12-014754-0
ISBN-10: 0-12-014754-8
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
USD 215
GBP 129.99
EUR 153.95
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Last update: 3 Oct 2009
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