Series Editor:
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Editor-in-Chief:
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Description
Advances in Imaging & Electron Physics merges two long-running serials--
Advances in Electronics & Electron Physics
and
Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices
(especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Included in series
Advances in Imaging and Electron Physics
Audience:
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
