Series Editor:
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Editor-in-Chief:
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Description
As a complement to
The Beginnings of Electron Microscopy,
Advances in Imaging and Electron Physics is
pleased to present Volume 96,
The Growth of Electron Microscopy. This comprehensive collection of articles surveys the
accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Included in series
Advances in Imaging and Electron Physics
Audience:
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
