The Growth of Electron Microscopy

The Growth of Electron Microscopy on ScienceDirect(Opens new window)

Published: JUL-1996
ISBN 10: 0-12-014738-6
ISBN 13: 978-0-12-014738-0
Imprint: ACADEMIC PRESS


Series Editor:
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.

Editor-in-Chief:
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Included in series
Advances in Imaging and Electron Physics

Audience:
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


 
Last update: 9 Feb 2012