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| THE GROWTH OF ELECTRON MICROSCOPY, 96
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Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
Included in series
Advances in Imaging and Electron Physics,
Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is
pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the
accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Contents
IFSEM:
V.E. Cosslett, Early History of the International Federation of Societies for Electron Microscopy. A.B.
Maunsbach and G. Thomas, IFSEM 1995: Objectives, Organization, and Functions.
Some Individual Societies:
P.S.
Turner and M. Vesk, Electron Microscopy in Australia. E.M. Horl, The Austrian Society for Electron Microscopy. H. Grumm
and P. Schiske, Reminiscences of Walter Glaser. D. Van Dyck, Electron Microscopy in Belgium.G.T. Simon and F.W. Doane,
The History of Electron Microscopy in Canada. Electron Microscopy in France: F. Haguenau, Early Findings in the Life Sciences. B. Jouffrey, The Development for Physics and Materials Science. H. Niedrig, The Early History of Electron Microscopy
in Germany. G. Schimmel, The History of the German Society for Electron Microscopy. J. Heydenreich, H. Luppa, A. Recknagel,
and D. Stiller, Electron Microscopy in the Former German Democratic Republic. S. Viragh and A. Csanady, The Hungarian Group
for Electron Microscopy. U. Valdre, Electron Microscopy in Italy. The Growth of Electron Microscopy in Japan: K. Yada,
Introduction. B. Tadano, The 37th Subcommittee of the Japanese Society for the Promotion of Science, 1939?1947. K. Yada,
History of Electron Microscopes at Tohoku University. A. Fukami, K. Adachi, and K. Asakura, Development of Electron Microscopes
at Tokyo Imperial University. K. Kanaya, Development of Electron Microscopes at the Electrotechnical Laboratory. K. Ura,
Early Electron Microscopes at Osaka University, 1934?1945. Electron Microscopy in the Netherlands: W. van Iterson, Earliest
Developments. P. Kruit, F.W. Schapink, J.W. Geus, A.J. Verkleij, and C.E. Hultstaert, Developments since the 1950s. A.B.
Maunsbach and B.A. Afzelius, The Development of Electron Microscopy in Scandinavia. M.J. Witcomb and S.A. Wolfe-Coote,
Electron Microscopy in Southern Africa.R.M. Fisher, Highlights in the Development of Electron Microscopy in the United States:
A Bibliography and Commentary of Published Accounts and EMSA Records.
Highlights of the IFSEM Congresses:
B.A. Afzelius,
Biology. J.L. Hutchison, Materials Science. P.W. Hawkes, Electron Optics.
Instrumental Developments:
A.W. Agar, The Story of European Commercial Electron Microscopes. G. Mollenstedt, My Early Work on Convergent-Beam
Electron Diffraction. H. Hashimoto, Atom Images and IFSEM Affairs in Kyoto, Osaka, and Okayama. M. von Ardenne, Reminiscences
on the Origins of the Scanning Electron Microscope and the Electron Microprobe. Microscopes and Microscopy in Japan: T. Komoda,
Electron MicroscopeDevelopment at Hitachi in the 1940s. K. Ito, Development of the Electron Microscope at JEOL. S.-I. Shimadzu,
Development and Application of Electron Microscopes, Model SM-1 Series, at Shimadzu Corporation. H. Kamogawa, Electron Microscope
Research at the Toshiba Corporation. Y. Tashiro and A. Oyama, Development of the Electron Microscope at Kyoto Imperial University
Faculty of Medicine. T. Komoda, Instrumentation. A. Ichikawa and Y. Watanabe, Application of Electron Microscopy to
Biological Science. Y. Hosaka and T. Hirano, Application of Electron Microscopy to Biological Science (Microbiology). H.
Fujita, Applications to Materials Science. K. Yada, Specimen Preparation Techniques. F. Lenz, Towards Atomic Resolution. L.Y. Huang, The Construction of Commercial Electron Microscopes in China.
Appendix:
P.W. Hawkes, Conference
Proceedings and Conference Abstracts. Subject Index.
| Bibliographic details |
Hardbound, 885 pages, publication date: JUL-1996
ISBN-13: 978-0-12-014738-0
ISBN-10: 0-12-014738-6
Imprint: ACADEMIC PRESS
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