 |
|
| IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS, 51A
| |
| | |
|
|
To order this title, and for more information, click here
Robert Willardson, Consulting Physicist, Spokane, Washington, U.S.A.
Michael Stavola, Lehigh University, Bethlehem, Pennsylvania
Eicke Weber, University of California, Berkeley, U.S.A.
Included in series
Semiconductors and Semimetals,
Description
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished
itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely
known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time
of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the
University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor
materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes.
Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures,
High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even
expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and
Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers
in modern industry.
Audience
Researchers, graduate students and practitioners in materials science (electronic materials field), and electrical engineering (field of electronic devices).
Contents
List of Contributors. Preface. G.D. Watkins, EPR and ENDOR Studies of Defects in Semiconductors. J.M. Spaeth, Magneto-optical
and Electrical Detection of Paramagnetic Resonance in Semiconductors. T.A. Kennedy and E.R. Glaser, Magnetic Resonance of Epitaxial
Layers Detected by Photoluminescence. K.H. Chow, B.Hitti and R.F. Kiefl, uSR on Muonium in Semiconductors and its Relation to
Hydrogen. K.Saarinen, P.Hautojarvi, and C. Corbel, Positron Annihilation Sprectroscopy of Defects in Semiconductors. R.
Jones and P.R. Briddon, The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors. Subject Index. Contents of Volumes
in This Series.
| Bibliographic details |
Hardbound, 376 pages, publication date: MAY-1998
ISBN-13: 978-0-12-752159-6
ISBN-10: 0-12-752159-3
Imprint: ACADEMIC PRESS
|
| Price and Ordering |
Price:
USD 215
GBP 129.99
EUR 153.95
|  |
Books and book related electronic products are priced in US dollars (USD), euro (EUR), and Great Britain Pounds (GBP). USD prices apply to the Americas and Asia Pacific. EUR prices apply in Europe and the Middle East. GBP prices apply to the UK and all other countries.
|
See also information about conditions of sale & ordering procedures, and links to our regional sales offices.
|
050/509
Last update: 3 Oct 2009
|
|
| |
| | |
|
|
| |
Home | Elsevier Sites | Privacy Policy | Terms and Conditions | Feedback | Site Map | A Reed Elsevier Company