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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 136
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By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances
in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor
devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave
propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Contents
Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI);
Chapter 2 - The S - State
Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK);
Chapter 3 - Measurement of Electric Fields
on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)
| Bibliographic details |
Hardbound, 352 pages, publication date: JUN-2005
ISBN-13: 978-0-12-014778-6
ISBN-10: 0-12-014778-5
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
GBP 110
EUR 160
USD 215
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Last update: 27 Sep 2008
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