Advances in Imaging and Electron Physics

Aberration-corrected microscopy
Advances in Imaging and Electron Physics on ScienceDirect(Opens new window)
Hardbound, 590 Pages
Published: DEC-2008
ISBN 13: 978-0-12-374220-9
Imprint: ACADEMIC PRESS

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Series Editor:
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Included in series
Advances in Imaging and Electron Physics

Audience:
All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


 
Last update: 6 Nov 2011