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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 138
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 To order this title, and for more information, click here
Edited By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
To order this title, and for more information, click here
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Contents
Chapter 1 - Spectral Color Spaces: Their Structure and Transformations (LENZ);
Chapter 2 - Phase Contrast Enhancement with Phase Plates
in Electron Microscopy (NAGAYAMA);
Chapter 3 - A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff);
Chapter 4 - On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANEJA);
Chapter 5 - Features and Future of
the International System of Units (SI) (VALDES);
Chapter 6 - The Importance Sampling Hough Transform (WALSH)
| Bibliographic details |
Hardbound, 392 pages, publication date: OCT-2005
ISBN-13: 978-0-12-014780-9
ISBN-10: 0-12-014780-7
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
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EUR 160
USD 215
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Last update: 27 Sep 2008
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