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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 132
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 To order this title, and for more information, click here
By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential
reading.
This volume looks at theory and it?s application in a practical sense, with a full account of the methods used and realistic
detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals
of the exciting developments in imaging and electron physics and apply them to realistic practical situations.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Contents
Evanescent Waves in the Near and the Far Field (ARNOLDUS); Symmetry and the Karhunen-Loeve Decomposition (LAHME); Analysis of Irregularly
Sampled Data: A Review (PIRODDI and PETROU); Recent Developments in the Microscopy of Ceramics (RAINFORTH); Five Dimensional Hamilton-Jacobi
Approach to Relativistic Quantum Mechanics (ROSE); Redundant Multiscale Transforms and Their Application for Morphological Component
Separation (STARK, ELAD and DONOHO)
| Bibliographic details |
Hardbound, 400 pages, publication date: AUG-2004
ISBN-13: 978-0-12-014774-8
ISBN-10: 0-12-014774-2
Imprint: ACADEMIC PRESS
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| Price and Ordering |
Price:
GBP 110
EUR 160
USD 215
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Last update: 27 Sep 2008
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