Edited by
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Description
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding.
This volume concentrates on microscopy and pattern recognition and also electron physics.
The text bridges the gap between academic
researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Included in series
Advances in Imaging and Electron Physics
Audience:
Researchers, academics, physicists and engineers working in the field of image and electron physics
