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A Note from the Editor
In 2009 Materials Characterization will be relaunched. It will continue to feature both original articles and short communications on theoretical and practical aspects of the microstructural characterization of materials. In addition, a new feature, tutorial reviews covering various characterization techniques, will appear on a frequent basis. The latter will be invited short reviews of around 5,000 words that will introduce the reader to the history, underlying physics, information provided and future directions of a particular characterization technique and will include examples, figures and key references.
Planned forthcoming tutorial reviews include articles on:
- Focused Ion Beam milling by Professor Paul Munroe
- Atom Probe Tomography by Dr. Mike Miller
- Scanning Probe Microscopy by Professor Asta Richter.
The Journal will continue to focus on all microstructural characterization techniques, including all forms of microscopy, microanalysis and diffraction. New developments in characterization techniques and their application to the quantification of the microstructure of materials are essential traits of the Journal.
The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include:
- Metals and alloys
- Ceramics
- Nanomaterials
- Biomedical materials
- Optical materials
- Composites
- Natural Materials
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