 |
|
| INTEGRATION, THE VLSI JOURNAL
| |
| | |
|
|
Editor-in-Chief:
F.V. Fernandez
See editorial board for all editors information
Invited papers on hot topics and future trends in VLSI technology
Description
Integration's aim is to cover every aspect of the VLSI area, with an
emphasis on cross-fertilization
between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as
closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well
as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following(non-exclusive) list
of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods
and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems;
High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms;
Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
| Bibliographic details |
ISSN: 0167-9260
Imprint: ELSEVIER
Commenced publication 1983
Subscriptions for the year 2009,
Volume 42,
4 issues |
| Price and Ordering |
Institutional online access: ScienceDirect eSelect
For purchase of online access to this journal on ScienceDirect.
|
Personal price:
USD 136 for all countries except Europe, Japan and Iran
JPY 15,600 for Japan
EUR 102 for European countries and Iran
|  |
Institutional price:
JPY 110,200 for Japan
USD 929 for all countries except Europe, Japan and Iran
EUR 833 for European countries and Iran
| |
Conditions of sale & ordering procedures, and links to our regional sales offices.
|
For an overview of recently-dispatched issues, see the Journal issue
dispatch dates
Audience
Researchers in (Computer-Aided) Design of VLSI, VLSI Chips, Process Technology, Electrical and Electronic Engineering.
Impact factor of this journal
2007: 0.268
© Journal Citation Reports 2008, published by Thomson Reuters
600/153
Last update: 15 Oct 2008
|
|
| |
| | |
|
|
| |
