Editors (2004-2015)

  • V. Sick

    University of Michigan, Ann Arbor, Michigan, USA

  • A. Tomlin

    University of Leeds, Leeds, UK

Editorial Board (2004 - 2015)

  • M.U. Alzueta

    Universidad de Zaragoza, Zaragoza, Spain

  • F. Behrendt

    Technische Universität Berlin (TUB), Berlin, Germany

  • J.H. Chen

    Sandia National Laboratories, Livermore, California, USA

  • M. Costa

    Instituto Superior Técnico, Lisboa, Portugal

  • H. Curran

    National University of Ireland, Galway, Ireland

  • P. Desgroux

    Université des Sciences et Technologies de Lille (Lille I), Villeneuve d'ascq Cedex, France

  • O. Deutschmann

    Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany

  • S.B. Dorofeev

    FM Global, Norwood, Massachusetts, USA

  • A. Dreizler

    Technische Universität Darmstadt, Darmstadt, Germany

  • T. Faravelli

    Politecnico di Milano, Milano, Italy

  • C. Fernandez-Pello

    University of California at Berkeley, Berkeley, California, USA

  • J. Frank

    Sandia National Laboratories, Livermore, California, USA

  • O. Gicquel

    Ecole Centrale Paris, Châtenay Malabry, France

  • N. Hansen

    Sandia National Laboratories, Livermore, California, USA

  • D.C. Haworth

    Pennsylvania State University, University Park, Pennsylvania, USA

  • A.J. Higgins

    McGill University, Montreal, Quebec, Canada

  • S. Ishizuka

    Hiroshima University, Higashi-Hiroshima, Japan

  • I-S. Jeung

    Seoul National University (SNU), Seoul, South Korea

  • J.M. Jones

    University of Leeds, Leeds, UK

  • Y. Ju

    Princeton University, Cambridge, Massachusetts, USA

  • A. Kempf

    Universität Duisburg-Essen, Duisburg, Germany

  • S. Klippenstein

    Argonne National Laboratory, Argonne, Illinois, USA

  • A. Konnov

    Lund University, Lund, Sweden

  • M. Koshi

    University of Tokyo, Tokyo, Japan

  • D.C. Kyritsis

    Khalifa University, Abu Dhabi, United Arab Emirates

  • K.N. Lakshmisha

    Indian Institute of Science, Bangalore, India

  • H.B. Levinsky

    Rijksuniversiteit Groningen, Groningen, Netherlands

  • T. Lieuwen

    Georgia Institute of Technology, Atlanta, Georgia, USA

  • G.T. Linteris

    National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA

  • T. Løvås

    Norwegian University of Science & Technology, Trondheim, Norway

  • A. Makino

    Japan Aerospace Exploration Agency (JAXA), Chofu, Tokyo, Japan

  • Y. Mantzaras

    Paul Scherrer Institute (PSI), Villigen-PSI, Switzerland

  • A.R. Masri

    University of Sydney, Sydney, New South Wales, Australia

  • K. McManus

    General Electric Corporation, Niskayuna, New York, USA

  • M. Mikami

    Yamaguchi University, Yamaguchi, Japan

  • A. Molina

    Universidad Nacional de Colombia, Medellín, Colombia

  • J. Oefelein

    Sandia National Laboratories, Livermore, California, USA

  • M. Olzmann

    Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany

  • F. Qi

    University of Science and Technology of China (USTC), Hefei, Anhui Province, China

  • G. Rein

    Imperial College London, London, UK

  • D. Reuss

    University of Michigan, Ann Arbor, Michigan, USA

  • M. Sarathy

    King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia

  • C. Schulz

    Universität Duisburg-Essen, Duisburg, Germany

  • K. Seshadri

    University of California at San Diego (UCSD), San Diego, California, USA

  • L. Tognotti

    Università di Pisa, Pisa, Italy

  • A. Trouvé

    University of Maryland, College Park, Maryland, USA

  • T. Turänyi

    Eötvös Lorand University, Budapest -112, Hungary

  • D. Veynante

    Ecole Centrale Paris, Châtenay-Malabry, France

  • H. Wang

    University of Southern California, Los Angeles, California, USA

  • M. Xu

    Shanghai Jiao Tong University, Shanghai, China

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