Editor-in-Chief

Editorial Board

  • E. Arunan

    Indian Institute of Science, Bangalore, India

  • V. Boudon

    Université Bourgogne Franche-Comté, Dijon, France

  • T. Carrington

    Queens University, Canada, Kingston, Ontario, Canada

  • S. Cooke

    State University of New York (SUNY) at Purchase, New York, New York, USA

  • G Douberly

    University of Georgia, Athens, Georgia, USA

  • A.M. Ellis

    University of Leicester, Leicester, UK

  • J.T. Hougen

    National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA

  • Y.C. Hsu

    Academia Sinica, Taipei, Taiwan, ROC

  • W. Jaeger

    University of Alberta, Edmonton, Alberta, Canada

  • P. Jensen

    Bergische Universität Wuppertal, Wuppertal, Germany

  • H. Kamamori

    Tokyo Institute of Technology

  • S. Kasahara

    Kobe University, Kobe, Japan

  • B.J. McCall

    University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

  • Y. Mo

    Tsinghua University, Beijing, China

  • A. Predoi-Cross

    University of Lethbridge, Lethbridge, Alberta, Canada

  • S. Schlemmer

    Universität zu Köln, Köln, Germany

  • T. Sears

    Brookhaven National Laboratory, Upton, New York, USA

  • N. Sibert

    University of Wisconsin at Madison, Madison, Wisconsin, USA

  • A.T.L. Tan

    Nanyang Technological University, Singapore

  • G. Tarczay

    Eötvös Lorand University, Budapest, Hungary

  • M.Y. Tretyakov

    Institute of Applied Physics, Nizhny Novgorod, Russian Federation

  • W.M.G. Ubachs

    VU University, Amsterdam, Netherlands

  • S. Widicus Weaver

    Emory University, Atlanta, Georgia, USA

  • S. Yu

    NASA Jet Propulsion Laboratory, Pasadena, California, USA

Editor Emeritus

  • A.J. Merer

    University of British Columbia, Vancouver, British Columbia, Canada