Theory of intense beams of charged particles

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: June 2011
  • ISBN: 978-0-12-381310-7

Table of Contents

  1. Beam equations
  2. Exact solutions to the beam equations
  3. Anti-paraxial expansions
  4. Solution of the beam formation problem in 3D case
  5. Asymptotic theory of 3D flows
  6. Geometrized theory
  7. Examples of applications