Size Effects in Thin Films

By

  • C.R. Tellier
  • A.J. Tosser

A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
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Book information

  • Published: January 1982
  • Imprint: NORTH-HOLLAND
  • ISBN: 978-0-444-42106-7