Silicon-Based Millimetre-wave Technology

Edited by

  • Jamal Deen, McMaster University, Hamilton, Ontario, Canada

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

 

Book information

  • Published: November 2012
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-394298-2


Table of Contents

  1. Measurement Techniques and Practical Issues
  2. Jamal Deen

  3. Transmission lines and passive components
  4. Guennadi A. Kouzaev

  5. Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
  6. Mohamed Bakr

  7. Field-effect types of transistors
  8. Benjamin Iniguez

    1. RF MEMS Devices for Communication Systems

    Mojgan Daneshmand

      6. Substrate-Integrated Antennas on Silicon

        Natalia K. Nikolova