Silicon-Based Millimetre-wave Technology
Edited by- Jamal Deen, McMaster University, Hamilton, Ontario, Canada
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 484 Pages
Published: November 2012
Imprint: Academic Press
ISBN: 978-0-12-394298-2
Contents
- Measurement Techniques and Practical Issues
Jamal Deen - Transmission lines and passive components
Guennadi A. Kouzaev - Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
Mohamed Bakr - Field-effect types of transistors
Benjamin Iniguez - RF MEMS Devices for Communication Systems
Mojgan Daneshmand - Substrate-Integrated Antennas on Silicon
Natalia K. Nikolova
- Measurement Techniques and Practical Issues
