Reliability and Failure of Electronic Materials and DevicesBy
- Milton Ohring, Stevens Institute of Technology, NJ, U.S.A.
- James Lloyd, Research Staff Engineer, IBM TJ Watson Research Center
Professional Materials Engineers working with materials used in electronic devices, including silicon chips; Electronics Engineers; Electrical Engineers; Manufacturing Engineers; Chemical Engineers
Paperback, 750 pages
Published: January 2010
Imprint: Academic Press