Principles of Semiconductor Network Testing

By

  • Amir Afshar, National Semiconductor

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
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Audience

Semiconductor design & test engineers

 

Book information

  • Published: June 1995
  • Imprint: NEWNES
  • ISBN: 978-0-7506-9472-8


Table of Contents

Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References