Particle Beam Physics, 105 book cover

Particle Beam Physics, 105

,

Published: October 1998

Imprint: Academic Press

ISBN: 978-0-12-014747-2

Reviews

  • "Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
    Praise for the Series, --MRS BULLETIN


    "With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
    --J.A. Chapman in LABORATORY PRACTICE

Contents

  • A. Åström and R. Forchheimer, Near-Sensor Image Processing. E. Oho, Digital Image Processing Technology for Scanning Electron Microscopy. H. Suzuki, Electron Gun Systems for Color CRTs. E. Yamazaki, Design and Performance of Shadow-Mask Color CRTs. Subject Index.

Advertisement

advert image