Partial Cumulative Index, 100
Cumulative Index
- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
,
Published: October 1997
Imprint: Academic Press
ISBN: 978-0-12-014742-7
Reviews
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"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTIC
Contents
- Cumulative index for all in-print volumes of:Advances in Electronics and Electron Physics, Volumes 63-89Advances in Imaging & Electron Physics, Volumes 90-99Advances in Optical & Electron Microscopy, Volumes 1-14
