Partial Cumulative Index, 100

Cumulative Index

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

      Audience

      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: October 1997
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014742-7

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN


"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTIC



Table of Contents

Cumulative index for all in-print volumes of:Advances in Electronics and Electron Physics, Volumes 63-89Advances in Imaging & Electron Physics, Volumes 90-99Advances in Optical & Electron Microscopy, Volumes 1-14