Concise Encyclopedia of Materials Characterization

Edited by

  • R.W. Cahn, University of Cambridge, UK
  • E. Lifshin, General Electric Corporate Research and Development, Schenectady, NY, USA

To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.

Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general.

The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.

This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.

Audience
For all materials scientists, chemists and engineers involved in research into any aspect of the characterization of materials.

Published: December 1992

Imprint: Pergamon

Reviews

  • ...after delving into this volume, one is far better equipped with the fundamental physical principles behind the various techniques, the classes of information that can be obtained, the types of specimen preparation that will be required, and indeed, some idea of whether it would be possible with one's own material...an excellent volume... Given the stables from which it derives, it is hardly a surprise that this is a first rate source.
    Alan Boyde, University College London, Scanning, 1993
    The Concise Encyclopedia of Materials Characterization provides an excellent review of the materials characterization field and will be a valuable source of information for either a specialist or novice in this area. I believe it to be an important addition to the collection of Concise Encyclopedias offered by Pergamon Press.
    Derek Budgell, Advanced Materials, 1994
    ...this book provides a valuable collection of concise yet reliable accounts, mostly written by internationally recognised experts, on nearly all the important techniques and many more. Articles are generally well illustrated and supplemented by useful lists of references, and access is facilitated by a good index...the editors are to be congratulated for the excellence of the cross-referencing and the admirable uniformity of level of treatment which has been achieved over the contributions from some 130 different authors, and upon the inclusion of useful articles on several techniques which have become viable research tools only in the past few years.... The book will prove a valuable and authoritative initial reference source for materials scientists or engineers needing to explore the techniques available to evaluate material properties, at the research or industrial development level. It is well produced and bound, and can be warmly recommended to the industrial or academic library with readers in any of the physical sciences or engineering, and also to research groups and indiduals working in the area of materials characterisation.
    I.M. Hutchings, Librarian, Department of Materials Science and Metallurgy, Science and Technology, 1995

Contents

  • Selected articles: Acoustic emission. Acoustic microscopy. Anodization spectroscopy. Art forgeries: scientific detection. Atomic force microscopy. Auger electron spectroscopy. Auger microscopy, angular distribution. Ceramic materials: cathodoluminescence analysis. Composite materials: nondestructive evaluation. Confocal optical microscopy. Corrosion and oxidation study techniques. Depth profiling. Elastomers: spectroscopic characterization. Electron diffraction. Electron diffraction, low-energy. Electron energy-loss spectrometry. Electron microprobe analysis. Electron microscopy, high-resolution. Electron spin resonance. Electron tunnelling spectroscopy. Field-ion microscopy: observation of radiation effects. Fractals. Gamma radiography. Grain size: nondestructive evaluation. Hardness characterization. Infrared spectroscopy. Junction transient spectroscopy. Laser microprobe mass spectrometry. Laser sampling inductively coupled plasma mass spectrometry. Liquid chromatography mass spectroscopy. Magnetic materials: measurements. Microengineering of materials: characterization. Neutron radiography. Nuclear magnetic resonance spectroscopy. Optical calorimetry. Optical emission spectroscopy. Particle-induced x-ray emission. Polymers: electron microscopy. Polymers: neutron scattering. Polymers: tests for mechanical properties. Porosity: characterization and investigation. Raman spectroscopy. Residual stresses: measurement using neutron diffraction. Scanning tunnelling microscopy and spectroscopy. Semiconducting materials: characterization by etching. Single-crystal x-ray diffraction. Small-angle neutron scattering in metallurgy. Solid state: study using muon beams. Stress distribution: analysis using thermoelastic effect. Thermal wave imaging. Thermophysical measurements, subsecond. Vibrothermography. Wood: acoustic emission and acousto-ultrasonic characteristics. X-ray and neutron diffraction studies of amorphous solids. X-ray diffraction, time-resolved. X-ray powder diffraction.

    numerous illus., 900 lit. refs.

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