Published: June 1997
...a timely publication...noteworthy...
D.K. Padma, Journal of the Electrochemical Society of India
- Introduction. Part One: Monolithic Arrays Detector elements and read-out means are provided in the same semiconductor body. Charge coupled device imagers. Ambipolar drift field imagers. Static induction transistor imagers. Charge injection device imagers. Charge imaging matrices. Part Two: Hybrid Arrays Detector elements and read-out means are provided in separate semiconductor bodies. Detector arrays with individual detector element read-out leads. Detector elements are provided with individual read-out leads formed in or on a non-active supporting substrate. Detector arrays without individual detector element read-out leads. Individual detector elements are provided with bump connectors or with no connectors at all. - Cross-talk preventing measures - Passivation and leakage current preventing measures. Flip-chip arrangements - Thermal stress preventing measures. Z-Technology arrangements. Detector arrays directly contacting the read-out chip - Connections made by through hole technologies. Patents number index. Inventor index. Company index. Subject index.