Identification of Defects in Semiconductors, 51B
- Robert Willardson, Consulting Physicist, Spokane, Washington, U.S.A.
- Eicke Weber, University of California, Berkeley, U.S.A.
- Michael Stavola, Lehigh University, Bethlehem, Pennsylvania
Researchers, graduate students and practitioners in materials science (electronic materials field), and electrical engineering (field of electronic devices).
- Published: October 1998
- Imprint: ACADEMIC PRESS
- ISBN: 978-0-12-752165-7