Developments in Surface Contamination and Cleaning - Vol 5

Contaminant Removal and Monitoring


  • Rajiv Kohli, National Aeronautics and Space Administration (NASA), Houston, Texas, USA
  • Kashmiri L. Mittal, Editor, Reviews of Adhesion and Adhesives

In this series, Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or dealing with the consequences of surface contamination.

This volume complements Volumes 3 and 4 of this series, which focused largely on particulate contaminants. The expert contributions in this volume cover methods for removal of non-particulate contaminants, such as metallic and non-metallic thin films, hydrocarbons, toxic and hazardous chemicals, and microbiological substances, as well as contamination monitoring in pharmaceutical manufacturing, and an innovative method for characterization at the nanoscale.

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As a whole, the series will create a unique and comprehensive knowledge base of crucial importance to those in research & development, manufacturing, quality control and procurement specification situated in a multitude of industries such as: aerospace, automotive, biomedical, defense, energy, manufacturing, microelectronics, optics and xerography. Researchers in an academic setting will also find these volumes excellent source books.


Book information

  • Published: November 2012
  • ISBN: 978-1-4377-7881-6

Table of Contents

  1. Surface Contamination Removal Using Dense Phase Fluids: Liquid and Supercritical Carbon Dioxide
  2. Plasma Cleaning for Electronic, Photonic, Biological and Archeological Applications
  3. Cleanroom Wipers for Removal of Surface Contamination
  4. Impact of Microbial Surface Contamination and Effective Environment Monitoring System in Pharmaceutical Manufacturing
  5. Neutron Holography as a Technique for Probing Local Atomic Structures on the Nanoscale