Complete Subject and Author Index, Including Supplements
Series Editor:- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices.
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 409 Pages
Published: September 1998
Imprint: Academic Press
ISBN: 978-0-12-014746-5
Reviews
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"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
Praise for the Previous Volumes , --MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
Contents
- Complete Subject and Author Index, Including Supplements.
