Complete Subject and Author Index, Including Supplements

Series Editor:

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
  • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.

Editor-in-Chief:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices.
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Audience

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: September 1998
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014746-5

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
Praise for the Previous Volumes, --MRS BULLETIN


"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE



Table of Contents

Complete Subject and Author Index, Including Supplements.