Advances in Optical and Electron Microscopy

Volume 13

Series Editor:

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
  • Charles Sheppard, The University of Sydney, Australia

Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists, and researchers interested in microscope instrumentation and applications rangingfrom biological techniques to materials research and industrial inspection.
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Audience

Microscopists, applied physicists, metallurgists, materials scientists, electrical and electronic engineers.

 

Book information

  • Published: February 1994
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-029913-3


Table of Contents

Microscopists, applied physicists, metallurgists, materials scientists, electrical and electronic engineers.