Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: February 2013
  • ISBN: 978-0-12-407670-9

Table of Contents

  1. Small Angle Scatter with Correlation, Scatter and Intermediate Functions
  2. Jay Theodore Cremer, Jr.

  3. Nuclear Scatter of Neutron Spin States
  4. Jay Theodore Cremer, Jr.

  5. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope
  6. Christian Dwyer

  7. Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques
  8. Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carré

  9. Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy
  10. Partha Pratim Mondal and Alberto Diaspro

  11. Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations

Stephen J. Sangwine