Advances in Imaging and Electron Physics
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
- Published: May 2000
- Imprint: ACADEMIC PRESS
- ISBN: 978-0-12-014754-0
ting by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
"With the accelerating pace of research and development in so many areas of microscopy, keeeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE