Advances in Imaging and Electron PhysicsSeries Editor:
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Advances in Imaging and Electron Physics
Hardbound, 338 Pages
Published: June 2000
Imprint: Academic Press
ting by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
"With the accelerating pace of research and development in so many areas of microscopy, keeeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE