Advances in Imaging and Electron Physics

Series Editor:

  • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.

Editor-in-Chief:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: April 1999
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014749-6

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
Praise for the Series, --MRS BULLETIN


"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE



Table of Contents

J. P. Bird, R. Akis, D. Ferry, and M. Stopa, Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots. Mohammad F. Alam and Mohammad A. Karim, External Optical Feedback Effects in DFB Semiconductor Lasers. A. Rosenauer and B. Gerthsen, Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images. R. C. Staunton, Hexagonal Sampling in Imaging Processing. Jeffrey Wood, The Group Representation Network: A General Approach to Invariant Pattern Classification.