Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

 

Book information

  • Published: April 2014
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-800265-0


Table of Contents

  1. Towards Quantitative Scanning Electron Microscopy
    Mohamed M. El-Gomati and Christopher G.H. Walker
  2. Logarithmic Wavelets
    Laurent Navarro, Guy Courbebaisse and Michel Jourlin
  3. 3D Sparse Representations
    Francois Lanusse, Jean-Luc Starck, Arnaud Woiselle and M. Jalal Fadili