Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Book information

  • Published: January 2014
  • ISBN: 978-0-12-800091-5

Table of Contents

  1. Octree Grid Topology Preserving Geometric Deformable Model
    Ying Bai, Xiao Han and Jerry L. Prince
  2. Second Order Variational Models for Image Texture Analysis
    Maïtine Bergounioux
  3. Electron Microscopy of Pharmaceutical Systems
    Victoria Klang and Nadejda B. Matsko