Advances in Imaging and Electron Physics
Series Editor:- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 280 Pages
Published: January 2012
Imprint: Academic Press
ISBN: 978-0-12-394396-5
Contents
- Precession Electron Diffraction
A. S. Eggeman and P. A. Midgley - Scanning Helium Ion Microscopy
R. Hill, J. A. Notte, and L. Scipioni - Signal reconstruction algorithm based on a single intensity in the Fresnel domain
Hone-Ene Hwang, Pin Han - Electron Microscopy Studies on Magnetic L10 FePd Nanoparticles
Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu - Fundamental aspects of Near Field Emission Scanning Electron Microscopy
D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis
- Precession Electron Diffraction
