Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

 

Book information

  • Published: January 2012
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-394396-5


Table of Contents

  1. Precession Electron Diffraction
    A. S. Eggeman and P. A. Midgley
  2. Scanning Helium Ion Microscopy
    R. Hill, J. A. Notte, and L. Scipioni
  3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain
    Hone-Ene Hwang, Pin Han
  4. Electron Microscopy Studies on Magnetic L10 FePd Nanoparticles
    Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
  5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy
    D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis