Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: May 2012
  • ISBN: 978-0-12-394297-5

Table of Contents

    1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
    2. G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

    3. Thermal Imaging in Medicine
    4. Lila Iznita Izhar and Maria Petrou

    5. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
    6. Jean-Michel Tualle

    7. Imaging Mass Spectrometry - Sample Preparation, Instrumentation and Applications
    8. Kamlesh Shrivas and Mitsutoshi Setou

    9. Transformation Optics
    10. Robert T. Thompson and Steven A. Cummer

    11. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
    12. Tobias Klein, Egbert Buhr and Carl Georg Frase

    13. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah