Advances in Imaging and Electron Physics book cover

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Hardbound, 440 Pages

Published: June 2012

Imprint: Academic Press

ISBN: 978-0-12-394297-5

Contents

    1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
      G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

    2. Thermal Imaging in Medicine
      Lila Iznita Izhar and Maria Petrou

    3. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
      Jean-Michel Tualle

    4. Imaging Mass Spectrometry - Sample Preparation, Instrumentation and Applications
      Kamlesh Shrivas and Mitsutoshi Setou

    5. Transformation Optics
      Robert T. Thompson and Steven A. Cummer

    6. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
      Tobias Klein, Egbert Buhr and Carl Georg Frase

    7. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics
      M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

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