Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: July 2011
  • ISBN: 978-0-12-385985-3

Table of Contents

  1. A History Of Cameca
  2. Emmanuel de Chambost

  3. Theory and Applications of General Adaptive Neighborhood Image Processing
  4. Johan Debayle, Jean-Charles Pinoli

  5. Shape Recognition Based on Eigenvalues of the Laplacian
  6. M. Ben Haj Rhouma, M.A. Khabou, L. Hermi

  7. Point Set Analysis
  8. Nicolas Lom´enie, Georges Stamon

  9. Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals

Leonid P. Yaroslavsky