Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: August 2011
  • ISBN: 978-0-12-385983-9

Table of Contents

  1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
  2. LucaGeretti, AntonioAbramo

  3. Logarithmic Image Processing for Color Images
  4. M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

  5. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
  6. Rainer A. Leitgeb

  7. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
  8. S.A. Nepijko, G. Schönhense

  9. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
  10. Chad M. Parish

  11. Aberration Correctors developed under Triple C Project
  12. Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

  13. Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher