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Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Series Editor:
  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Included in series
Advances in Imaging and Electron Physics

Hardbound, 392 Pages

Published: August 2011

Imprint: Academic Press

ISBN: 978-0-12-385983-9

Contents

    1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach

      2. LucaGeretti, AntonioAbramo

    2. Logarithmic Image Processing for Color Images

      3. M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

    3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography

      4. Rainer A. Leitgeb

    4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy

      5. S.A. Nepijko, G. Schönhense

    5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging

      6. Chad M. Parish

    6. Aberration Correctors developed under Triple C Project

      7. Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

    7. Spatially resolved thermoluminescence in a scanning electron microscope

    T. Schulz, M. Albrecht, K.Irmscher

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