Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Series Editor:- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 392 Pages
Published: August 2011
Imprint: Academic Press
ISBN: 978-0-12-385983-9
Contents
- The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
Luc aGeretti, Antonio Abramo - Logarithmic Image Processing for Color Images
M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs - Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
Rainer A. Leitgeb - Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
S.A. Nepijko, G. Schönhense - Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
Chad M. Parish - Aberration Correctors developed under Triple C Project
Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga - Spatially resolved thermoluminescence in a scanning electron microscope
T. Schulz, M. Albrecht, K.Irmscher
- The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
