Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Series Editor:

Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Included in series
Advances in Imaging and Electron Physics

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Hardbound, 296 Pages

Published: June 2010

Imprint: Academic Press

ISBN: 978-0-12-381316-9

1. Energy Filtered X-ray Photoemission electron
microscopy(EXPEEM)
- Kiyotaka Asakura
2. Image contrast in aberration-corrected scanning
confocal electron microscopy
- E.C. Cosgriff
3. Comparison of color demosaicing methods
- O. Lossona
4. New dimensions for field emission: effects of structure in the emitting surface
- C. J. Edgcombe
5. Conductivity Imaging and Generalised Radon
Transform: a review
- Archontis Giannakidis
6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy
- A. Sever kapin

Advances in Imaging and Electron Physics

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