Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

 

Book information

  • Published: June 2010
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-381316-9


Table of Contents

1. Energy Filtered X-ray Photoemission electron
microscopy(EXPEEM)
- Kiyotaka Asakura

2. Image contrast in aberration-corrected scanning
confocal electron microscopy
- E.C. Cosgriff

3. Comparison of color demosaicing methods
- O. Lossona

4. New dimensions for field emission: effects of structure in the emitting surface
- C. J. Edgcombe

5. Conductivity Imaging and Generalised Radon
Transform: a review
- Archontis Giannakidis

6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy
- A. Sever Å kapin