Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Series Editor:- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 248 Pages
Published: July 2010
Imprint: Academic Press
ISBN: 978-0-12-381314-5
Contents
- Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin
- Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa
- Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI
- Superresolution Imaging - Revisited - Markus E. Testorf
- Methods and Limitations of Subwavelength Imaging Andrew Neice
