Advances in Imaging and Electron Physics

The scanning transmission electron microscope

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: November 2009
  • ISBN: 978-0-12-374986-4

Table of Contents

Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)

Andreas Engel, STEM in the life sciences

Peter Hawkes, The AEI and Siemens STEM instruments

Hiromi Inada, STEM in Japan

Michael S. Isaacson, Early work on the STEM

Bernard Jouffrey, The Toulouse high-voltage STEM project

Ondrej Krivanek, Aberration-corrected STEM

K.C.A. Smith, STEM in Cambridge

Lyn Swanson and Greg Schwind, A review of the cold field electron cathode

Sebastian von Harrach, STEM in Oxford and at Vacuum Generators

Ian Wardell and Peter Bovey, The Vacuum Generators STEM

Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory