Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
View full description


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: July 2009
  • ISBN: 978-0-12-374769-3

Table of Contents

1, Surface plasmon enhanced photoemission and electron acceleration with ultrashort laser pulses,


2, Physics and the Pioneers of Microscopy,


3, Image decomposition: theory, numerical schemes and performance evaluation,


4, The reverse fuzzy distance transform and its use when studying the shape of macromolecules from cryo-electron tomographic data, Svensson*

5, Anchors of Morphological Operators and Algebraic Openings,


6, Temporal Filtering Technique using Time Lenses for Optical Transmission Systems, Yang,  Kumar, Wang