Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: July 2009
  • ISBN: 978-0-12-374768-6

Table of Contents

1. Charged particles in electromagnetic fields2. Language of aberration expansions in charged particle optics3. Transporting charged particle beams in static fields4. Transporting charged particles in radiofrequency fields5. Static magnetic charged particle analyzers6. Electrostatic energy analyzers7. Mass analyzers with combined electrostatic and magnetic fields8. Time-of-flight mass analyzers9. Radiofrequency mass analyzers