Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Series Editor:- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 373 Pages
Published: July 2009
Imprint: Academic Press
ISBN: 978-0-12-374768-6
Contents
- 1. Charged particles in electromagnetic fields2. Language of aberration expansions in charged particle optics3. Transporting charged particle beams in static fields4. Transporting charged particles in radiofrequency fields5. Static magnetic charged particle analyzers6. Electrostatic energy analyzers7. Mass analyzers with combined electrostatic and magnetic fields8. Time-of-flight mass analyzers9. Radiofrequency mass analyzers
